Beilstein J. Nanotechnol.2016,7, 284–295, doi:10.3762/bjnano.7.26
fundamental mode, and phase imaging on the higher eigenmode.
Keywords: atomic force microscopy; charge sensing; feedthrough cancellation; multimodesensor; piezoelectric cantilever; self-sensing; Introduction
Emerging methods in multifrequency atomic force microscopy (MF-AFM) rely on the detection and
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Figure 1:
Simplified cross-section schematic of a beam with bonded piezoelectric layer. An electric field E3 ...